From 980b0dbc25e1b423562b87bc402c09329c039212 Mon Sep 17 00:00:00 2001 From: Farshid Monhaseri Date: Tue, 10 Nov 2020 14:20:08 +0330 Subject: Add 'scan' verb for runtime device scan Changes: - Add 'scan' verb so client can pass 'filter'(udev rules in JSON format) and 'mask' (desired data fields mask) arguments. 'filter' & 'mask' can include 'properties' and 'attributes' sub- fields so their key & values act as parameters for device scanning and mask the scanned devices properties & attributes when service report back. The 'filter' argument can contain an additional field with 'tags' key and JSON array value hence the tags will match for device scanning too. Bug-AGL: SPEC-3512 Signed-off-by: Farshid Monhaseri Change-Id: I83e91ec4405a8144e1ee813633c4895214b5b9df --- src/platform-info-devices.h | 3 ++- 1 file changed, 2 insertions(+), 1 deletion(-) (limited to 'src/platform-info-devices.h') diff --git a/src/platform-info-devices.h b/src/platform-info-devices.h index ad658f9..59944d6 100644 --- a/src/platform-info-devices.h +++ b/src/platform-info-devices.h @@ -45,6 +45,7 @@ typedef struct { }pinfo_client_ctx_t; -int pinfo_device_monitor(afb_req_t req); +int pinfo_device_monitor(afb_req_t req); +struct json_object* pinfo_device_scan(json_object *jfilter, json_object* jmask); #endif -- cgit 1.2.3-korg