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| author |   Farshid Monhaseri <monhaseri.f@gmail.com> | 2020-11-10 14:20:08 +0330 |
|---|---|---|
| committer |   Jan-Simon Moeller <jsmoeller@linuxfoundation.org> | 2020-11-10 15:04:30 +0000 |
| commit | 980b0dbc25e1b423562b87bc402c09329c039212 (patch) | |
| tree | bf579d7e5125e9926b1da9f3afdd58c861af3ea8 /test/afb-test/tests/aft-BasicAPITests.lua | |
| parent | 172db50c33beeb53f8e75c115699179be880b960 (diff) | |
Add 'scan' verb for runtime device scan
Changes:
- Add 'scan' verb so client can pass 'filter'(udev rules in JSON
format) and 'mask' (desired data fields mask) arguments.
'filter' & 'mask' can include 'properties' and 'attributes' sub-
fields so their key & values act as parameters for device scanning
and mask the scanned devices properties & attributes when service
report back. The 'filter' argument can contain an additional field
with 'tags' key and JSON array value hence the tags will match for
device scanning too.
Bug-AGL: SPEC-3512
Signed-off-by: Farshid Monhaseri <monhaseri.f@gmail.com>
Change-Id: I83e91ec4405a8144e1ee813633c4895214b5b9df
Diffstat (limited to 'test/afb-test/tests/aft-BasicAPITests.lua')
0 files changed, 0 insertions, 0 deletions