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authorFarshid Monhaseri <monhaseri.f@gmail.com>2020-11-10 14:20:08 +0330
committerJan-Simon Moeller <jsmoeller@linuxfoundation.org>2020-11-10 15:04:30 +0000
commit980b0dbc25e1b423562b87bc402c09329c039212 (patch)
treebf579d7e5125e9926b1da9f3afdd58c861af3ea8 /test/afb-test
parent172db50c33beeb53f8e75c115699179be880b960 (diff)
Add 'scan' verb for runtime device scan
Changes: - Add 'scan' verb so client can pass 'filter'(udev rules in JSON format) and 'mask' (desired data fields mask) arguments. 'filter' & 'mask' can include 'properties' and 'attributes' sub- fields so their key & values act as parameters for device scanning and mask the scanned devices properties & attributes when service report back. The 'filter' argument can contain an additional field with 'tags' key and JSON array value hence the tags will match for device scanning too. Bug-AGL: SPEC-3512 Signed-off-by: Farshid Monhaseri <monhaseri.f@gmail.com> Change-Id: I83e91ec4405a8144e1ee813633c4895214b5b9df
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