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-rw-r--r--roms/u-boot/include/test/test.h136
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diff --git a/roms/u-boot/include/test/test.h b/roms/u-boot/include/test/test.h
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+++ b/roms/u-boot/include/test/test.h
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+/* SPDX-License-Identifier: GPL-2.0+ */
+/*
+ * Copyright (c) 2013 Google, Inc.
+ */
+
+#ifndef __TEST_TEST_H
+#define __TEST_TEST_H
+
+#include <malloc.h>
+#include <linux/bitops.h>
+
+/*
+ * struct unit_test_state - Entire state of test system
+ *
+ * @fail_count: Number of tests that failed
+ * @start: Store the starting mallinfo when doing leak test
+ * @of_live: true to use livetree if available, false to use flattree
+ * @of_root: Record of the livetree root node (used for setting up tests)
+ * @root: Root device
+ * @testdev: Test device
+ * @force_fail_alloc: Force all memory allocs to fail
+ * @skip_post_probe: Skip uclass post-probe processing
+ * @expect_str: Temporary string used to hold expected string value
+ * @actual_str: Temporary string used to hold actual string value
+ */
+struct unit_test_state {
+ int fail_count;
+ struct mallinfo start;
+ struct device_node *of_root;
+ bool of_live;
+ struct udevice *root;
+ struct udevice *testdev;
+ int force_fail_alloc;
+ int skip_post_probe;
+ char expect_str[256];
+ char actual_str[256];
+};
+
+/* Test flags for each test */
+enum {
+ UT_TESTF_SCAN_PDATA = BIT(0), /* test needs platform data */
+ UT_TESTF_PROBE_TEST = BIT(1), /* probe test uclass */
+ UT_TESTF_SCAN_FDT = BIT(2), /* scan device tree */
+ UT_TESTF_FLAT_TREE = BIT(3), /* test needs flat DT */
+ UT_TESTF_LIVE_TREE = BIT(4), /* needs live device tree */
+ UT_TESTF_CONSOLE_REC = BIT(5), /* needs console recording */
+ /* do extra driver model init and uninit */
+ UT_TESTF_DM = BIT(6),
+};
+
+/**
+ * struct unit_test - Information about a unit test
+ *
+ * @name: Name of test
+ * @func: Function to call to perform test
+ * @flags: Flags indicated pre-conditions for test
+ */
+struct unit_test {
+ const char *file;
+ const char *name;
+ int (*func)(struct unit_test_state *state);
+ int flags;
+};
+
+/**
+ * UNIT_TEST() - create linker generated list entry for unit a unit test
+ *
+ * The macro UNIT_TEST() is used to create a linker generated list entry. These
+ * list entries are enumerate tests that can be execute using the ut command.
+ * The list entries are used both by the implementation of the ut command as
+ * well as in a related Python test.
+ *
+ * For Python testing the subtests are collected in Python function
+ * generate_ut_subtest() by applying a regular expression to the lines of file
+ * u-boot.sym. The list entries have to follow strict naming conventions to be
+ * matched by the expression.
+ *
+ * Use UNIT_TEST(foo_test_bar, _flags, foo_test) for a test bar in test suite
+ * foo that can be executed via command 'ut foo bar' and is implemented in
+ * function foo_test_bar().
+ *
+ * @_name: concatenation of name of the test suite, "_test_", and the name
+ * of the test
+ * @_flags: an integer field that can be evaluated by the test suite
+ * implementation
+ * @_suite: name of the test suite concatenated with "_test"
+ */
+#define UNIT_TEST(_name, _flags, _suite) \
+ ll_entry_declare(struct unit_test, _name, ut_ ## _suite) = { \
+ .file = __FILE__, \
+ .name = #_name, \
+ .flags = _flags, \
+ .func = _name, \
+ }
+
+/* Get the start of a list of unit tests for a particular suite */
+#define UNIT_TEST_SUITE_START(_suite) \
+ ll_entry_start(struct unit_test, ut_ ## _suite)
+#define UNIT_TEST_SUITE_COUNT(_suite) \
+ ll_entry_count(struct unit_test, ut_ ## _suite)
+
+/* Use ! and ~ so that all tests will be sorted between these two values */
+#define UNIT_TEST_ALL_START() ll_entry_start(struct unit_test, ut_!)
+#define UNIT_TEST_ALL_END() ll_entry_start(struct unit_test, ut_~)
+#define UNIT_TEST_ALL_COUNT() (UNIT_TEST_ALL_END() - UNIT_TEST_ALL_START())
+
+/* Sizes for devres tests */
+enum {
+ TEST_DEVRES_SIZE = 100,
+ TEST_DEVRES_COUNT = 10,
+ TEST_DEVRES_TOTAL = TEST_DEVRES_SIZE * TEST_DEVRES_COUNT,
+
+ /* A few different sizes */
+ TEST_DEVRES_SIZE2 = 15,
+ TEST_DEVRES_SIZE3 = 37,
+};
+
+/**
+ * testbus_get_clear_removed() - Test function to obtain removed device
+ *
+ * This is used in testbus to find out which device was removed. Calling this
+ * function returns a pointer to the device and then clears it back to NULL, so
+ * that a future test can check it.
+ */
+struct udevice *testbus_get_clear_removed(void);
+
+static inline void arch_reset_for_test(void)
+{
+#ifdef CONFIG_SANDBOX
+#include <asm/state.h>
+
+ state_reset_for_test(state_get_current());
+#endif
+}
+
+#endif /* __TEST_TEST_H */